MIRO Calibration Procedure for FM Thermal Vacuum Test Prepared by S. Gulkis Approved by: Margaret A. Frerking MIRO Project Manager DOCUMENT CHANGE LOG CHANGE NUMBER CHANGE DATE PAGES AFFECTED CHANGES/ NOTES GENERAL COMMENTS 1 16 Apr 2001 All Initial Release 2 24 May 2001 Issue 1, Rev 1 Updated linearity procedure and IF sweep procedure CONTENTS 1 Objective 5 2 Test Approach 5 2.1 Temperature Profile 5 2.2 Instrument Modes 5 2.3 Instrument Configuration 6 3 Tests with Instrument in Flight Configuration 7 4 Special tests 8 4.1 Noise Figure of the IFP 8 4.2 Noise Figure of the CTS 9 4.3 IF Frequency Sweep Test 9 4.4 Linearity in CTS/Dual Mode 10 4.5 Linearity in Dual Continuum Mode 11 4.6 LO lock and Frequency Switching Test 11 5 Detailed Test Procedures 12 5.1 Test Sequence To Be Repeated at Each Temperature with Instrument in Flight Configuration 12 5.2 Test Sequence To Be repeated at each temperature with the Instrument in the Test Port Configuration 14 List of Figures Figure 1: Instrument Configuration in Thermal Vacuum Figure 2: Nominal Recabling of instrument for special tests Acronyms AMP Amplifier Ana Analog Bd Board C Centigrade Cal Calibration Curr Current Deg degrees DET Detector ECal Electronics Unit Calibration EID-B Experiment Interface Document, Part B EQM Electrical Qualification Model ERR Error EU Electronics Unit FS1 Frequency Synthesizer 1 (2182 MHz) FS2 Frequency Synthesizer 2 (7147 MHz) FS3 Frequency Synthesizer 3 (7728 MHz) IF Intermediate Frequency IFP Intermediate Frequency Processor LFT Limited Functional Test LNA Low Noise Amplifier ( mm or smm) LO Local Oscillator MIRO Microwave Instrument for the Rosetta Orbiter MM Millimeter Mult Multiplier OB Optical Bench PLL Phase Lock Loop Pwr Power RF Radio Frequency SBEU Sensor Backend Electronics Unit Sen_El Sensor Electronics SMM Submillimeter Spect Spectrometer Temp Temperature TLM Telemetry TRP Temperature Reference Point V Voltage 1 Objective The objective of the Thermal Vacuum Calibration is to provide calibration parameters in vacuum and as a function of temperature. Emphasis is on those parameters that cannot be obtained under ambient conditions. 2 Test Approach 2.1 Temperature Profile For Calibration the temperature will be stepped in 10C increments from -15C to +55C as shown in the FM Thermal Vacuum Test Plan (RO-MIR-PL-0026). The CTS heaters need to be set at each temperature a minimum of 20C above the interface temperature as shown in the Table below. CTS Warmup and Heater Control Telecommand Table TV temperature, C Power (always high) Warmup and Heater Warmup Heater temperature Heater Control temperature -15 0 1(=10 C) 2(=20 C) -5 0 2(=20 C) 3(=30 C) 5 0 3(=30 C) 4(=40 C) 15 0 4(=40 C) 5(=50 C) 25 0 5(=50 C) 6(=60 C) 35 0 6(=60 C) 7(=70 C) 45 0 7(=70 C) 7(=70 C) 55 0 7(=70 C) 7(=70 C) 2.2 Instrument Modes The instrument has several science data taking modes. * Millimetre-wave continuum * Submillimeter wave continuum * Dual continuum * CTS/Submillimeter wave continuum * CTS-dual continuum Each mode is characterized by a different power loading and in general operates at different temperatures. Separate function tests will test the functionality of each of these modes. Tests carried out in this procedure have been designed to operate either in the Dual continuum mode or the CTS/Dual continuum mode. The Dual continuum mode tests the continuum channels with frequency switching turned off. The CTS/dual continuum mode tests the spectroscopic capability and the continuum mode with frequency switching turned on. Frequency switching introduces a 5 sec periodicity in the data that is not present when it is off. In addition to the normal data taking modes, it is possible to command the millimeter- and submillimeter-wave Low Noise Amplifiers (LNAs) to the Off mode. In the Off mode, the zero input level backend electronics noise can be determined. We also plan to test various warm up rates and modes such as the CTS Warm up mode. 2.3 Instrument Configuration For the first part of the calibration, the instrument will be configured as for flight. At least one additional thermistor will be placed on each LNA (mm and smm). The LNA can be powered off and on under software control. The calibration mirror can be stepped incrementally in the forward and backward directions under computer control as well as moving to directly to the space, hot load, and cold load positions. The instrument cold load will be cooled with a liquid nitrogen cooled cold plate. A large (approximately 50 x 50 cm) absorbing load (Space qualified Tessalating TeraHertz RAM) for the 100 to 1000 GHz region will be placed in front of the MIRO telescope. Five thermistors will be imbedded in the load to provide the temperature of the absorber. The instrument configuration is shown in Figure 1. Figure 1: Thermal Vacuum Configuration After the first series of calibration tests are completed, the vacuum chamber will be opened and test cables attached to instrument test ports as shown in Figure 1. The nominal configuration is shown in Figure 2. Each special test will instrument the test ports in different ways. Figure 2: Nominal Recabling of instrument for special tests. 3 Tests with Instrument in Flight Configuration The following tests will be carried out with the instrument in the flight configuration using instrument commands. 1. USO Warmup Time and Stability 2. CTS Warmup Time 3. CTS/dual Mode System Stabilization Time 4. CTS/dual Mode Receiver Noise Temperature and Gain 5. Phase Lock Performance Verification 6. IF Noise Temperature 7. CTS/dual Mode System Stability 8. Dual Continuum Mode System Stabilization Time 9. Dual Mode Receiver Noise Temperature and Gain 10. Dual Mode System Stability 11. Cold Load Characterization 4 Special tests 4.1 Noise Figure of the IFP The objective of this test is to measure the contribution to the system noise temperature of the IFP. This test is operated in CTS/Dual continuum mode. Record Trace A/B on spectrum analyser as below. The test ports are configured as follows: Connector No. Signal Name Trace A, "LNA on" Trace B, "LNA off" J311A mm RFE IF out: nominal nominal J310 IFP mm IF in: nominal nominal J305 smm RFE IF out: nominal nominal J311B IFP smm IF in: nominal nominal J381 PLL Test Port: nominal nominal J304 IFP out: spectrum analyser spectrum analyser J307 CTS in: termination termination J3xx Spare: nominal nominal Use the following settings for spectrum analyzer (stored in Recall, State 2): Press "Recall" button Press "Recall State" menu button Press "State 2" menu button Use these steps to capture trace A/B on spectrum analyzer Turn LNA Off Press "Trace" button Press "Trace A/B" menu button to toggle to "B" Press "Write Clear B" menu button Press "View B" menu button Press "Trace A/B" menu button to toggle to "A" Turn LNA On Record spectrum on computer Use these steps to record spectra on computer Doubler Click on BenchLink icon to start program if not started Click on "Trace Data" Click on "New..." Click on "Select All" (Traces A + B) File Save Path: My Computer\D:\MIRO\Flight\TV_testing\TVxxxx.tdx Write filename in logbook 4.2 Noise Figure of the CTS The objective of this test is to measure the contribution to the system noise temperature of the CTS. This test is operated in CTS/Dual continuum mode. Trigger an Instrument calibration in each of the configurations below. Record the IFP output spectrum on the spectrum analyser in the "IFP Off" configuration. The test ports are configured as follows: Connector No. Signal Name Spectrum, "IFP On" Spectrum, "IFP Off" J311A mm RFE IF out: nominal nominal J310 IFP mm IF in: nominal nominal J305 smm RFE IF out: nominal nominal J311B IFP smm IF in: nominal nominal J381 PLL Test Port: nominal termination J304 IFP out: nominal spectrum analyser (Recall, State 2) J307 CTS in: nominal termination J3xx Spare: nominal nominal 4.3 IF Frequency Sweep Test The objective of this test is to measure the frequency response of the instrument with an input at its 1st IF. The input will be a CW of -66 dBm (~1 Mcnt in one CTS channel) at the IFP smmRFE input injected via a coupler at the following "IFP smm input" frequencies and triggering a calibration. IFP smm input [GHz] IFP output [GHz] Output Filter CTS [chan] 5.753 1.389 FL1 2937 5.877 1.270 FL7 228 9.667 1.425 FL3 3759 9.685 1.407 FL3 3344 10.791 1.301 FL4 932 13.455 1.363 FL2 2342 15.137 1.339 FL6 1808 16.338 1.320 FL5 1365 This test is operated in CTS/Dual continuum mode. The test ports are configured as follows: Connector No. Signal Name J311A mm RFE IF out: nominal J310 IFP mm IF in: nominal J305 smm RFE IF out: nominal attenuation J311B IFP smm IF in: Sig Gen on smm coupler J381 PLL Test Port: nominal J304 IFP out: nominal J307 CTS in: nominal J3xx Spare: nominal 4.4 Linearity in CTS/Dual Mode The objective of this test is to measure the linearity of the mm continuum channel, smm continuum channel, and CTS spectroscopic channels when operated in spectroscopic mode with CTS on and frequency switching on. This test is operated in CTS/Dual continuum mode. Chopped Noise Source Setup: Configure Wavetek model 23 function generator for 0.1-0.5 Hz, 0-6V square wave. Turn off function generator. On back panel of HP- E3615A power supply, connect function generator output to "CV" + and - terminals, and slide "CV" switch to remote mode. Connect LNA to supply output. While monitoring power supply output on oscilloscope, turn on function generator and power supply. Output should be 0-12V square wave. This setup will turn the noise source on and off at a 50% duty cycle. Inject chopped noise sources through couplers on each of the RFE inputs to the IFP and at each of the following settings of attenuation trigger an instrument calibration: smm attenuator (dB) mm attenuator (dB) high RF power 13.5 4.5 nominal 15.5 6.5 low RF power 17.5 8.5 The test ports are configured as follows: Connector No. Signal Name J311A mm RFE IF out: mm attenuator J310 IFP mm IF in: mm noise source on mm coupler J305 smm RFE IF out: nominal J311B IFP smm IF in: smm attenuator J381 PLL Test Port: smm noise source on smm coupler J304 IFP out: nominal J307 CTS in: nominal J3xx Spare: nominal 4.5 Linearity in Dual Continuum Mode The objective of this test is to measure the linearity of the mm continuum channel and smm continuum channel when operated in continuum mode with frequency switching off. This test is operated in Dual continuum mode. See Section 4.4 for Chopped Noise Source description. Inject chopped noise sources through couplers on each of the RFE inputs to the IFP and at each of the following setting of attenuators trigger an instrument calibration: smm attenuator (dB) mm attenuator (dB) high RF power 13.5 4.5 nominal 15.5 6.5 low RF power 17.5 8.5 The test ports are configured as follows: Connector No. Signal Name J311A mm RFE IF out: mm attenuator J310 IFP mm IF in: mm noise source on mm coupler J305 smm RFE IF out: nominal J311B IFP smm IF in: smm attenuator J381 PLL Test Port: smm noise source on smm coupler J304 IFP out: nominal J307 CTS in: nominal J3xx Spare: nominal 4.6 LO lock and Frequency Switching Test The objective of this test is to verify that the LO remains locked and the frequency switching is clean as a function of temperature. This test is operated in CTS/Dual continuum mode. Record these spectra from the PLL/PLE Test Port as below capturing both nominal frequencies (1598.0 MHz and 1600.5 MHz) (center/span): 1598/300 1598/30 1598/3 The test ports are configured as follows: Connector No. Signal Name J311A mm RFE IF out: nominal J310 IFP mm IF in: nominal J305 smm RFE IF out: nominal J311B IFP smm IF in: nominal J381 PLL Test Port: Spectrum analyser J304 IFP out: nominal J307 CTS in: nominal J3xx Spare: nominal Use the following settings for spectrum analyzer (stored in Recall, State 0): Press "Recall" button Press "Recall State" menu button Press "State 0" menu button Press "SPAN" button Enter desired Span on the key pad followed by the units 5 Detailed Test Procedures 5.1 Test Sequence To Be Repeated at Each Temperature with Instrument in Flight Configuration The test sequence is given in the Table below. Each step, along with the time it occurs shall be recorded in the instrument logbook. The total test sequence takes 16 hours. A calibration is performed at 30 minute intervals, including a calibration with the millimeter-wave and submillimeter-wave LNA off. Commands that need to be entered are followed by a "/". Lapsed Time (hr:min) duratui on (min) Command / Activity Applicable Tests and Parameters 0:0 0 /assume instrument starts in Engr. mode Cold start from engineering mode 0:0 30 USO warmup mode / USO Warmup Time Test 0:30 30 CTS warmup mode,Heater=0(high),T=1(10C) / At eact temperature level change, change temperature in accordance with following table CTS Warmup Test:CTS remembers H & T Saw device warmup 1:00 0 CTS-dual mode/ 15 /calibrate (automatic) Calibrate and warm up IFP 1:15 1 mm LNA off, submm LNA off/ 1:20 4 CTS-dual mode /( force calibration) IF Noise Temperature + dc offsets 1:25 1 mm LNA on, submm LNA on/ 29 /Let CTS-dual Mode system stabilize CTS-dual Mode Stabilization Time 1:55 35 CTS-dual mode/calibrate (automatic1) Receiver Noise Temperature, stability and gain 2:30 35 CTS-dual mode/calibrate (automatic2) Receiver Noise Temperature, stability and gain 3:05 35 CTS-dual mode/calibrate (automatic3) Receiver Noise Temperature, stability and gain 3:40 35 CTS-dual mode/calibrate (automatic4) Receiver Noise Temperature, stability and gain 4:15 35 CTS-dual mode/calibrate (automatic5) Receiver Noise Temperature, stability and gain 5:50 35 CTS-dual mode/calibrate (automatic6) Frequency Switching Verification, Phase Lock Loop Performance Verification, CTS- dual Mode System Stability Test 6:25 35 CTS-dual mode/calibrate (automatic7) CTS-dual Mode Receiver Noise Temperature 7:00 35 CTS-dual mode/calibrate (automatic8) Frequency Switching Verification, Phase Lock Loop Performance Verification, CTS- dual Mode System Stability Test 7:35 35 CTS-dual mode/calibrate (automatic9) CTS-dual Mode Receiver Noise Temperature 8:10 35 CTS-dual mode/calibrate (automatic10) Frequency Switching Verification, Phase Lock Loop Performance Verification, CTS- dual Mode System Stability Test 8:45 35 CTS-dual mode/calibrate (automatic11) 9:20 35 mm LNA off, submm LNA off 9:55 5 CTS-dual mode ( force calibration) F Noise Temperature + dc offsets 10:00 1 mm LNA on, submm LNA on/ Frequency Switching Verification, Phase Lock Loop Performance Verification, CTS- dual Mode System Stability Test 29 /Let CTS-dual Mode system stabilize 10:30 35 CTS-dual mode/calibrate (automatic12) CTS-dual Mode Receiver Noise Temperature 11:05 30 CTS Heater Control,Heater =0(High),T=2(20C)/warm up At eact temperature level change, change temperature in accordance with following table Test heater control 11:35 35 CTS-dual mode/calibrate (automatic) Frequency Switching Verification, Phase Lock Loop Performance Verification, CTS- dual Mode System Stability Test 12:10 35 CTS-dual mode/calibrate (automatic) Frequency Switching Verification, Phase Lock Loop Performance Verification, CTS- dual Mode System Stability Test 12:45 35 CTS-dual mode/calibrate (automatic) CTS-dual Mode Receiver Noise Temperature 13:25 35 Dual continuum mode/ Frequency Switching Verification, Phase Lock Loop Performance Verification, CTS- dual Mode System Stability Test 14:00 35 Dual continuum mode/ CTS-dual Mode Receiver Noise Temperature 14:35 35 Dual continuum mode/ Frequency Switching Verification, Phase Lock Loop Performance Verification, CTS- dual Mode System Stability Test 15:10 1 Mm lna off, smm lna off/ CTS-dual Mode Receiver Noise Temperature 15:11 4 Dual continuum mode/ force calibration Frequency Switching Verification, Phase Lock Loop Performance Verification, CTS- dual Mode System Stability Test 15:15 15 mm LNA on, submm LNA on/warm up 15:30 30 Run Dual Continuum Mode 16:00 Change temperature level After new temperature level is achieved Repeat this sequence - Remember to increase the temperature setting For CTS warm up mode and CTS Heat mode 5.2 Test Sequence To Be repeated at each temperature with the Instrument in the Test Port Configuration Lapsed Time (hr:min) duratuion (min) Command / Activity Applicable Tests and Parameters 0:00 0:00 /assume instrument starts in Engr. mode Cold start from engineering mode 0:30 0:30 USO warmup mode / USO Warmup Time Test 1:00 0:30 CTS warmup mode,Heater=0(high),T=1(10C) / CTS Warmup Test:CTS remembers H & T 1:00 0:00 CTS-dual mode/ 1:15 0:15 /calibrate (automatic) Calibrate and warm up IFP 1:16 0:01 mm LNA off, submm LNA off/ 1:20 0:04 CTS-dual mode /( force calibration) IF Noise Temperature + dc offsets 1:21 0:01 mm LNA on, submm LNA on/ 1:50 0:29 /Let CTS-dual Mode system stabilize CTS-dual Mode Stabilization Time 2:25 0:35 CTS-dual mode/calibrate (automatic1) Receiver Noise Temperature, stability 1:00 1:00 carry out Noise Figure of IFP Procedure Noise Figure of CTS 2:00 1:00 carry out Noise Figure of CTS Procedure IF Frequency Sweep Test 3:00 1:00 carry out Spectroscopic Linearity Procedure Linearity of Submm Spectroscopic and Continuum Systems 3:30 0:30 carry out LO Lock and Freq Switch Procedure Verify LO lock and Frequency Switching 4:00 0:30 mode change /Dual mode stabilize in Dual Cont. mode 4:01 0:01 mm LNA off, submm LNA off/ dc offsets and IF noise temperature 4:05 0:04 dual mode/(force calibration) 4:06 0:01 mm LNA on, submm LNA on/ 4:35 0:29 /Let Dual Cont. Mode system stabilize stabilize and noise temperature 5:35 1:00 carryout Dual Cont. Linearity procedure Linearity of Continuum Systems w/o CTS 6:05 0:30 cmd to Engineering mode, let all data read out read out data Change temperature level